The effect of composition on the formation of light-emitting Si nanostructures in SiOx layers on irradiation with swift heavy ions
Creators
- 1. Russian Academy of Sciences, Institute of Semiconductor Physics, Siberian Branch (Russian Federation)
- 2. Joint Institute for Nuclear Research (Russian Federation)
Description
The SiOx layers different in composition (0 < x < 2) are irradiated with Xe ions with the energy 167 MeV and the dose 1014 cm−2 to stimulate the formation of light-emitting Si nanostructures. The irradiation gives rise to a photoluminescence band with the parameters dependent on x. As the Si content is increased, the photoluminescence is first enhanced, with the peak remaining arranged near the wavelength λ ≈ 600 nm, and then the peak shifts to λ ≈ 800 nm. It is concluded that the emission sources are quantum-confined nanoprecipitates formed by disproportionation of SiOx in ion tracks due to profound ionization losses. Changes in the photoluminescence spectrum with increasing x are attributed firstly to the increase in the probability of formation of nanoprecipitates and then to the increase in their dimensions; the latter effect is accompanied with a shift of the emission band to longer wavelengths. The subsequent quenching of photoluminescence is interpreted as a result of the removal of quantum confinement in nanoprecipitates and their coagulation.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 45
- Journal Issue
- 3
- Journal Page Range
- p. 408-414
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43094948
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DOSES; HEAVY IONS; IONIZATION; IRRADIATION; LAYERS; NANOSTRUCTURES; OXIDATION; PEAKS; PHOTOLUMINESCENCE; PROBABILITY; QUENCHING; SILICON OXIDES; SPECTRA
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL REACTIONS; EMISSION; IONS; LUMINESCENCE; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Pleiades Publishing, Ltd.