Study on ion chromatographic separation behavior of Zr and Hf on a cation exchange column
Creators
- 1. Radioanalytical Chemistry Div., Bhabha Atomic Research Centre, Mumbai (India)
Description
Zr and Hf based materials are important in nuclear technology. Zr is used in the manufacture of cladding materials whereas Hf is a neutron absorber. All Zr based materials used in the nuclear technology have stringent specification limit for Hf and therefore, determination of trace Hf in Zr materials is one of the essential requirements in the chemical characterization procedure. Since the two elements have similar chemical properties, the analysis of trace Hf in Zr matrix is a difficult task. XRF, the widely employed technique for the determination of trace Hf in Zr matrix, requires matrix (Zr) correction or suppression during the analysis. There is a growing interest in developing analytical methodologies for the determination of nuclear materials using liquid chromatography techniques where separation and determination of elements having similar chemical properties is possible
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of DAE-BRNS biennial symposium on emerging trends in separation science and technology
- Imprint Pagination
- 274 p.
- Journal Page Range
- p. 161
Conference
- Title
- 5. DAE-BRNS biennial symposium on emerging trends in separation science and technology
- Acronym
- SESTEC-2012
- Dates
- 27 Feb - 1 Mar 2012
- Place
- Mumbai (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 44017306
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- HAFNIUM; ION EXCHANGE CHROMATOGRAPHY; TRACE AMOUNTS; X-RAY FLUORESCENCE ANALYSIS; ZIRCONIUM
- Descriptors DEC
- CHEMICAL ANALYSIS; CHROMATOGRAPHY; ELEMENTS; METALS; NONDESTRUCTIVE ANALYSIS; REFRACTORY METALS; SEPARATION PROCESSES; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 2 refs., 1 fig.