Published January 1, 2010
| Version v1
Journal article
Synthesis and characterization of spherical core-shell particles SiO2-AgEu(MoO4)2
Creators
- 1. Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Hubei Province, Wuhan 430074 (China)
Description
Submicron spherical SiO2 particles have been coated with AgEu(MoO4)2 phosphor layers by a sol-gel process, followed by surface reaction at high temperature, to get core/shell structured SiO2-AgEu(MoO4)2 particles. X-ray diffraction (XRD), Fourier-transformed infrared spectroscopy (FT-IR), field emission scanning electron microscopy (FE-SEM), and transmission electron microscopy (TEM) were used to characterize the structure and morphology of the resulted core-shell phosphors. The luminescent properties of the core-shell structured phosphors have also been measured at room temperature, and their photoluminescence (PL) spectra are similar to the pure AgEu(MoO4)2 phosphor prepared by the same sol-gel method exhibiting red emission.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.10.006Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.10.006;
- PII
- S0169-4332(09)01422-6;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 256
- Journal Issue
- 6
- Journal Page Range
- p. 1798-1802
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44018420
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; EUROPIUM COMPOUNDS; FIELD EMISSION; FOURIER TRANSFORM SPECTROMETERS; INFRARED SPECTRA; LAYERS; MOLYBDATES; PHOSPHORS; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES; SILVER COMPOUNDS; SOL-GEL PROCESS; SURFACES; SYNTHESIS; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; LUMINESCENCE; MEASURING INSTRUMENTS; MICROSCOPY; MOLYBDENUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RARE EARTH COMPOUNDS; REFRACTORY METAL COMPOUNDS; SCATTERING; SILICON COMPOUNDS; SPECTRA; SPECTROMETERS; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.