Published December 1, 2013 | Version v1
Journal article

A computational study of the effects of linear doping profile on the high-frequency and switching performances of hetero-material-gate CNTFETs

  • 1. College of Electronic Science Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210046 (China)

Description

The effects of linear doping profile near the source and drain contacts on the switching and high-frequency characteristics for conventional single-material-gate CNTFET (C-CNTFET) and hetero-material-gate CNTFET (HMG-CNTFET) have been theoretically investigated by using a quantum kinetic model. This model is based on two-dimensional non-equilibrium Green's functions (NEGF) solved self-consistently with Poisson's equations. The simulation results show that at a CNT channel length of 20 nm with chirality (7, 0), the intrinsic cutoff frequency of C-CNTFETs reaches up to a few THz. In addition, a comparison study has been performed between C-and HMG-CNTFETs. For the C-CNTFET, results reveal that a longer linear doping length can improve the cutoff frequency and switching speed. However, it has the reverse effect on on/off current ratios. To improve the on/off current ratios performance of CNTFETs and overcome short-channel effects (SCEs) in high-performance device applications, a novel CNTFET structure with a combination of an HMG and linear doping profile has been proposed. It is demonstrated that the HMG structure design with an optimized linear doping length has improved high-frequency and switching performances as compared to C-CNTFETs. The simulation study may be useful for understanding and optimizing high-performance of CNTFETs and assessing the reliability of CNTFETs for prospective applications. (semiconductor devices)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/34/12/124002

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
34
Journal Issue
12
Journal Page Range
[6 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47018465
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CHIRALITY; COMPARATIVE EVALUATIONS; DESIGN; SEMICONDUCTOR DEVICES; SIMULATION
Descriptors DEC
EVALUATION; PARTICLE PROPERTIES