Published 2005
| Version v1
Journal article
Precision measurements on highly charged ions with the X-ray crystal spectrometer of the Heidelberg EBIT
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Praezisionsmessungen an hochgeladenen Ionen mit dem Roentgenkristallspektrometer der Heidelberger EBIT
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Volume
- 40
- Journal Issue
- 3
- Journal Page Range
- p. 33
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 36072266
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- CAMERAS; CHARGE-COUPLED DEVICES; CRYOGENICS; CRYSTALS; DE-EXCITATION; ELECTRON COLLISIONS; EXCITED STATES; MULTICHARGED IONS; POSITION SENSITIVE DETECTORS; SEMICONDUCTOR DETECTORS; TITANIUM IONS; TRAPS; X-RAY DETECTION; X-RAY DIFFRACTION; X-RAY SPECTROMETERS
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; COLLISIONS; DETECTION; DIFFRACTION; ENERGY LEVELS; ENERGY-LEVEL TRANSITIONS; IONS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DEVICES; SPECTROMETERS