Published January 1987
| Version v1
Journal article
On the contribution of the kinetic mechanism into secondary ion emission
Description
The contribution of the kinetic mechanism in to secondary atomic ion emission under ion bombardment of Al and Mg has been estimated. In terms of the results obtained differences between the experimental dependences of Al+ and Mg+ ion yields on the incident angle of primary ions at the target surface have been explained
Additional details
Additional titles
- Original title (Russian)
- О вкладе кинетического механизма в эмиссию вторичных ионов
Publishing Information
- Journal Title
- Poverkhn.: Fiz., Khim., Mekh.
- Journal Issue
- no.1
- Series
- Poverkhn.: Fiz., Khim., Mekh.
- CODEN
- PFKMD
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 18066844
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM; ALUMINIUM IONS; ANGULAR DISTRIBUTION; ARGON IONS; AUGER EFFECT; INCIDENCE ANGLE; ION EMISSION; KEV RANGE 10-100; MAGNESIUM; MAGNESIUM IONS; POLYCRYSTALS; SECONDARY EMISSION
- Descriptors DEC
- ALKALINE EARTH METALS; ATOMIC IONS; CHARGED PARTICLES; CRYSTALS; DISTRIBUTION; ELEMENTS; EMISSION; ENERGY RANGE; IONS; KEV RANGE; METALS