Published December 2008 | Version v1
Journal article Metadata-only

Measurements of the total molecular differential attenuation coefficients of some compounds for scattering of γ-rays

Creators

  • 1. Department of Physics Education, Faculty of Education, Erzincan University, Erzincan (Turkey)

Description

The differential attenuation coefficients for total scattering have been measured using the Si(Li) detector at photon excitation energy of 59.5 keV for Fe2O3, Y2O3, Nb2O5, SeO2, Sb2O5 and BaO compounds at seven angles ranging from 60 deg. to 120 deg. at intervals of 10 deg. The obtained results have been compared with relativistic and non-relativistic theoretical values

Availability note (English)

Available from http://dx.doi.org/10.1016/j.anucene.2008.08.002

Additional details

Identifiers

DOI
10.1016/j.anucene.2008.08.002;
PII
S0306-4549(08)00214-4;

Publishing Information

Journal Title
Annals of Nuclear Energy (Oxford)
Journal Volume
35
Journal Issue
12
Journal Page Range
p. 2327-2331
ISSN
0306-4549
CODEN
ANENDJ

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40045534
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANTIMONY OXIDES; ATTENUATION; BARIUM OXIDES; FERRITES; GAMMA RADIATION; IRON OXIDES; LI-DRIFTED SI DETECTORS; NIOBATES; NIOBIUM OXIDES; PHOTONS; RELATIVISTIC RANGE; SCATTERING; SELENIUM OXIDES; YTTRIUM OXIDES
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; ANTIMONY COMPOUNDS; BARIUM COMPOUNDS; BOSONS; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; FERRIMAGNETIC MATERIALS; IONIZING RADIATIONS; IRON COMPOUNDS; LI-DRIFTED DETECTORS; MAGNETIC MATERIALS; MASSLESS PARTICLES; MATERIALS; MEASURING INSTRUMENTS; NIOBIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; RADIATION DETECTORS; RADIATIONS; REFRACTORY METAL COMPOUNDS; SELENIUM COMPOUNDS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.