Published April 15, 2001 | Version v1
Journal article Metadata-only

Trace element analysis by means of particle induced X-ray emission with triggered beam pulsing

Creators

  • 1. Marburg Univ. (Germany, F.R.). Fachbereich Physik

Description

A triggered beam deflection system is described which is of advantage in PIXE analysis. It offers high counting rate capability due to efficient pile-up suppression, strongly reduced target damage, and it does not require dead-time corrections in quantitative analysis. (Auth.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods
Journal Volume
142
Journal Issue
1-2
Series
Nucl. Instrum. Methods.
Journal Page Range
225-229

Conference

Title
International conference on particle induced X-ray emission and its analytical applications.
Dates
23 - 26 Aug 1976.
Place
Lund, Sweden.

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
8327507
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM PULSERS; COUNTING RATES; ELEMENTS; LINE BROADENING; PARTICLE BEAMS; POWER AMPLIFIERS; PULSE PILEUP; QUANTITATIVE CHEMICAL ANALYSIS; TRACE AMOUNTS; TRIGGER CIRCUITS; X-RAY EMISSION ANALYSIS; X-RAY SPECTRA
Descriptors DEC
AMPLIFIERS; BEAMS; CHEMICAL ANALYSIS; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; NONDESTRUCTIVE ANALYSIS; PULSE CIRCUITS; SPECTRA