Published 1987 | Version v1
Miscellaneous Metadata-only

Silicon monocrystal characterization using infrared microscopy and X-ray topography

Creators

  • 1. Sao Paulo Univ., Sao Carlos, SP (Brazil). Inst. de Fisica e Quimica
  • 2. TELEBRAS, Campinas (Brazil). Centro de Pesquisas

Description

Published in summary form only

Additional details

Additional titles

Original title (Portuguese)
Caracterizacao de monocristais de silicio utilizando microscopia de infravermelho e topografia de raios X

Publishing Information

Imprint Title
Proceedings of the 10. National Meeting on Condensed Matter Physics
Imprint Pagination
192 p.
Journal Page Range
p. 38.
Report number
INIS-BR--1164

Conference

Title
10. National Meeting on Condensed Matter Physics.
Dates
5-8 May 1987.
Place
Caxambu, MG (Brazil).

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
19069998
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
COMPARATIVE EVALUATIONS; COPPER; CRYSTAL DEFECTS; DIFFUSION; INFRARED SPECTRA; LITHIUM; MONOCRYSTALS; SILICON; X-RAY SPECTROSCOPY
Descriptors DEC
ALKALI METALS; CRYSTAL STRUCTURE; CRYSTALS; ELEMENTS; EVALUATION; METALS; SEMIMETALS; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENTS

Optional Information

Notes
Imprint:Anais do 10. Encontro Nacional de Fisica da Materia Condensada.