Laser-induced damage properties of subwavelength antireflective grating on fused silica
- 1. College of Science, Zhejiang University of Technology, Hangzhou 310023 (China)
- 2. Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, No. 390 Qinghe Road, Jiading District, Shanghai, D.C. 201800 (China)
- 3. Institute of Information Optical Engineering, Soochow University, Suzhou 215006 (China)
- 4. Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang, Sichuan 621900 (China)
Description
We describe the design, fabrication and performance of an optimized one-dimensional subwavelength grating for use in 1064 nm wavelength laser systems. The laser-induced damage threshold (LIDT) under the irradiation of 12 ns 1064 nm pulses on the grating was performed, and a higher LIDT was obtained compared with LIDT of traditional antireflective coatings. Laser irradiation produces some morphological modifications on grating. Light interferometric surface profiler, scanning electron microscope and atomic force microscope were used to study these modifications, and these studies indicate the significant ablation and resolidification have occurred. To understand possible damage mechanisms, the role of electric field distribution inside the grating during the laser radiation process was investigated by a three-dimensional finite difference time-domain method, and the simulation result indicates the temperature distribution resulting from the internal electric field may be the main factor behind the damage. - Highlights: • Antireflective (AR) gratings are designed and manufactured on fused silica. • Simulated transmittance and experimental results show a similar tendency. • Higher laser-induced damage threshold obtained compared to mutilayer AR coatings. • The damage mechanisms are analyzed by simulating electric field distribution
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2014.07.028Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2014.07.028;
- PII
- S0040-6090(14)00749-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 567
- Journal Page Range
- p. 47-53
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47004190
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABLATION; ATOMIC FORCE MICROSCOPY; COATINGS; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; ELECTRIC FIELDS; FABRICATION; HOLOGRAPHY; INTERFEROMETRY; LASER RADIATION; PULSED IRRADIATION; SCANNING ELECTRON MICROSCOPY; SILICA; SOLIDIFICATION; SURFACES; TEMPERATURE DISTRIBUTION; VISIBLE RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; EVALUATION; IRRADIATION; MICROSCOPY; MINERALS; OXIDE MINERALS; PHASE TRANSFORMATIONS; RADIATIONS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.