Published December 1990 | Version v1
Journal article

A new method for using 252CF in SEU testing

  • 1. Rensselaer Polytechnic Inst., Troy, NY (USA)
  • 2. Jet Propulsion Lab., Pasadena, CA (USA)
  • 3. Grumman Corp., Bethpage, NY (USA). Corporate Research Center

Description

A system using 252Cf and associated nuclear instrumentation has determined the SEU cross section versus LET curve for several 2kx8 SRAMs. The 252Cf fission fragments pass through at thin film organic scintillator detector (TFD) on the way to the device under test (DUT). The TFD provides energy information for each transiting fragment. Data analysis provides the energy of the individual ion responsible for each SEU, thus separate upset cross sections can be developed for different energy and mass regions of the californium spectrum. The authors report on this measurement of separate cross sections for each fission fragment group. This californium-based device is quite small and fits onto a bench top. It provides a convenient and inexpensive supplement or alternative to accelerator and high-altitude/space SEU testing

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
37
Journal Issue
6
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
1916-1922
ISSN
0018-9499
CODEN
IETNA

Conference

Title
27. IEEE annual conference on nuclear and space radiation effects.
Dates
16-20 Jul 1990.
Place
Reno, NV (USA).

Optional Information

Secondary number(s)
CONF-900723--.