Published September 2014 | Version v1
Journal article

Etching characteristic studies for the detection of alpha particles in DAM–ADC nuclear track detector

  • 1. Physics Department, Faculty of Science, Menoufia University, Shebin ElKom (Egypt)
  • 2. Physics Department, Faculty of Education, Ain Shams University, Cairo (Egypt)
  • 3. Physics Department, Faculty of Women, Ain Shams University, Cairo (Egypt)
  • 4. Physics Department, Faculty of Science and Arts, Najran University, Najran 1101 (Saudi Arabia)
  • 5. Atomic Energy Research Institute, Kinki University, Kowakae, Higashi-Osaka 577-8502 (Japan)

Description

This study reports the characteristic studies for the detection of alpha particles in DAM–ADC nuclear track detector. Several important parameters that control the track formation such as, the bulk etch rate (VB), track etching rate (VT), dependence of VB and VT on etching concentration and temperature have been extensively studied. The activation energy (Eb) of the bulk etching rate for the DAM–ADC sheets has been calculated, the dependence of etching efficiency and sensitivity upon etchant concentrations and temperature has been investigated, registration efficiency of DAM–ADC detector etched at the optimum etching condition has been examined. The detailed studied results presented in this study provide various useful information about the mechanism of track formation in polymers. - Highlights: • Detection of alpha particles in DAM–ADC nuclear track detector. • The activation energy of the bulk etching rate for the DAM–ADC sheets. • The dependence of etching efficiency upon etchant concentrations • Registration efficiency of DAM–ADC detector

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radphyschem.2014.04.022

Additional details

Identifiers

DOI
10.1016/j.radphyschem.2014.04.022;
PII
S0969-806X(14)00150-9;

Publishing Information

Journal Title
Radiation Physics and Chemistry (1993)
Journal Volume
102
Journal Page Range
p. 79-83
ISSN
0969-806X
CODEN
RPCHDM

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.