Three-dimensional study of Ni aluminides in an AlSi12 alloy by means of light optical and synchrotron microtomography
- 1. Vienna University of Technology, Institute of Materials Science and Technology, Karlsplatz 13/308, A-1040 Vienna (Austria)
- 2. European Synchrotron Radiation Facility, BP 220, 6 Rule Jules Horowitz, 38043 Grenoble Cedex (France)
Description
The three-dimensional (3D) microstructure of an AlSi12Ni alloy in as-cast and in solution-treated conditions is characterized by light optical and synchrotron tomography. Eutectic Al-Si alloys containing 1 wt.% Ni in as-cast condition present networks of connected Si lamellae as well as complex 3D shapes of Ni-containing aluminides. The eutectic Si networks disintegrate during solution treatment in the binary Al-Si alloy while they remain connected in the Al-Si-Ni alloy. The contiguity between eutectic Si and Ni-containing aluminides is maintained, when the alloy is solution treated at 540 deg. C for 24 h. The sphericity of the aluminides is only slightly increased by the solution treatment. The reinforcing role of eutectic Si together with the Ni-containing aluminides is governed by a stable interconnectivity and contiguity of these rigid phases accumulating ∼20 vol.%. The 3D data obtained by synchrotron tomography quantify connectivity, shape and volume fraction of eutectic Si and aluminides, whereas their contiguity is verified by light optical sectioning tomography.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2009.05.010Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2009.05.010;
- PII
- S1359-6454(09)00307-3;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 57
- Journal Issue
- 14
- Journal Page Range
- p. 4125-4132
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43038913
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; EUTECTICS; LAMELLAE; MICROSCOPY; MICROSTRUCTURE; SHAPE; SILICON ALLOYS; SOLUTIONS; SYNCHROTRON RADIATION; SYNCHROTRONS; TOMOGRAPHY; VISIBLE RADIATION; X RADIATION
- Descriptors DEC
- ACCELERATORS; ALLOYS; BREMSSTRAHLUNG; CYCLIC ACCELERATORS; DIAGNOSTIC TECHNIQUES; DISPERSIONS; ELECTROMAGNETIC RADIATION; HOMOGENEOUS MIXTURES; IONIZING RADIATIONS; MIXTURES; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.