Measurement of the electron distribution function in TFR Via soft X-ray analysis
Creators
Description
The X-ray energy spectra in the range 0.4 to 30 keV, corresponding to the optimal performance of the silicon detector used, were studied in the TFR tokamak. Electron temperatures in the center of the tokamak were determined with an uncertainty of 10 to 20 %, in agreement with results from other diagnostics. After studying ohmic plasmas, electron temperature increase in ECRH plasmas was measured. Plasma impurity content was evaluated using the effective ion charge in the plasma, only determining an integrated value along a plasma filament, with a considerable uncertainty of the order of 30 %. Results are however coherent with those of spectroscopic diagnostics. Deviation from a Maxwellian distribution of the electron velocity distribution function was measured, starting from the shape, Maxwellian or not, of the detected soft X-ray spectra. It is shown that in the suprathermal regime, the distribution function can be considered as the sum of two maxwellians, the associated temperatures corresponding respectively to the thermal (0.5 to 10 keV) and suprathermal (10 to 30 keV) parts
Availability note (English)
MF available from INIS under the Report Number.Abstract (French)
On a etudie les spectres X en energie dans la gamme 0,5-30 keV, correspondant aux performances optimales du detecteur silicium utilise, dans le tokamak TFR. On a deduit des valeurs de temperature electronique au centre du plasma avec une incertitude comprise entre 10 et 20 %, ces valeurs etant en accord avec celles fournies par d'autres diagnostics. Apres avoir etudie des plasmas ohmiques, on a mesure l'elevation de temperature electronique pour des plasmas chauffes par des ondes a la frequence cyclotronique electronique. Le contenu en impuretes du plasma a ete evalue par l'intermediaire de la charge effective des ions du plasma, dont on a determine uniquement une valeur integree le long d'une corde de plasma, avec une incertitude importante, de l'ordre de 30 %. Les resultats sont neanmoins coherents avec ceux des diagnostics spectroscopiques. On a mesure des ecarts a la maxwellienne de la fonction de distribution des vitesses des electrons, a partir de la forme, maxwellienne ou non, des spectres X mous detectes. On montre que, en regime suprathermique, la fonction de distribution peut etre consideree comme la somme de deux maxwelliennes, les temperatures associees correspondant respectivement aux parties thermique (0,5 a 10 keV) et suprathermique (10 a 30 keV) de la distributionFiles
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Additional details
Additional titles
- Original title (French)
- Mesure de la Fonction de distribution des electrons sur T.F.R. a partir de l'analyse du rayonnement X-Mou
Publishing Information
- Imprint Pagination
- 264 p.
- Report number
- FRCEA-TH--136
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 20027724
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- ANGULAR VELOCITY; BOLTZMANN STATISTICS; DISTRIBUTION FUNCTIONS; ELECTRON TEMPERATURE; KEV RANGE 01-10; PLASMA DIAGNOSTICS; SOFT X RADIATION; TFR TOKAMAK; X-RAY EMISSION ANALYSIS; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHEMICAL ANALYSIS; CLOSED PLASMA DEVICES; ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SPECTROSCOPY; THERMONUCLEAR DEVICES; TOKAMAK DEVICES; VELOCITY; X RADIATION