Published April 2019 | Version v1
Journal article Metadata-only

Systematic investigations on the effect of prolong UV illumination on optoelectronic properties of ZnO honeycomb nanostructures

Creators

  • 1. Molecular and Nanoelectronics Research Group (MNRG), Department of Electrical Engineering, IIT Indore, Indore 453552, Madhya Pradesh (India)
  • 2. Department of Physics and Nano Functional Materials Technology Centre, IIT Madras, Chennai 600036 (India)
  • 3. Mechatronics and Instrumentation Lab, Department of Mechanical Engineering, IIT Indore, Indore 453552, Madhya Pradesh (India)

Description

Herein, the effect of prolong UV illumination over ZnO optoelectronic characteristics has been investigated. The photoluminescence analysis has shown significant enhancement in deep level emission (DLE) after sample being exposed to UV radiations. The formation of photo-induced oxygen vacancies (VO) over the ZnO surface was found to be responsible for such noteworthy enhancement in DLE. The observed phenomenon was further utilized for controlled incorporation of VO in ZnO via UV illumination, towards obtaining optimal device performance. The UV treated photo-detector has shown significantly high photo-responsivity and photo-sensitivity in the deep UV region.

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2018.12.029;
PII
S1359646218307644;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
163
Journal Page Range
p. 1-4
ISSN
1359-6462
CODEN
SCMAF7

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55043133
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ILLUMINANCE; NANOSTRUCTURES; PERFORMANCE; PHOTODETECTORS; PHOTOLUMINESCENCE; SURFACES; ULTRAVIOLET RADIATION; VACANCIES; ZINC OXIDES
Descriptors DEC
CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; EMISSION; LUMINESCENCE; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; POINT DEFECTS; RADIATIONS; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.