Long-period tetragonal lattice formation by solid-state alloying at the interfaces of Bi-Mn double-layer thin films
- 1. Kobe Univ. (Japan). Dept. of Applied Physics
Description
Thin Bi-Mn double-layer films, consisting of a Bi layer of 300 A in thickness and an Mn layer of 200 A prepared by successive vacuum deposition, were heated at 538 K for 100-200 h. Transmission electron micrographs show that a long-period tetragonal lattice forms at their interfaces, whose lattice constants were a=17.26, c=10.21 A. Near to the tetragonal lattice grains, structures preliminary to lattice formation were observed. Their electron diffraction and high-resolution micrographs show that the formation process can be divided into two stages. In the first stage, Bi and Mn atoms combine to form polyatomic clusters 16 A in diameter, which have a twelvefold symmetry axis normal to the (001) surface of the Bi crystals. In the second stage, these polyatomic clusters arrange themselves to build up the long-range tetragonal order. (orig.)
Additional details
Publishing Information
- Journal Title
- Acta Crystallographica, Section B: Structural Science
- Journal Volume
- 45
- Journal Issue
- 1
- Series
- Acta Crystallogr., Sect. B: Struct. Sci.
- Journal Page Range
- 40-45
- ISSN
- 0108-7681
- CODEN
- ASBSD
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 20038675
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- BISMUTH; BISMUTH ALLOYS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; EXPERIMENTAL DATA; FERROMAGNETIC MATERIALS; HEAT TREATMENTS; HIGH TEMPERATURE; INTERFACES; LATTICE PARAMETERS; MANGANESE; MANGANESE ALLOYS; SYMMETRY; TETRAGONAL LATTICES; THIN FILMS; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DATA; DIFFRACTION; ELEMENTS; FILMS; INFORMATION; MAGNETIC MATERIALS; MATERIALS; METALS; MICROSCOPY; NUMERICAL DATA; SCATTERING; TRANSITION ELEMENTS