Published October 1, 1991
| Version v1
Journal article
Improved VO2 thin films for infrared switching
Creators
- 1. LTV Missiles and Electronics Group, P.O. Box 650003, MS WT-50, Dallas, Texas, (USA)
Description
Vanadium dioxide (VO2) undergoes a thermally induced phase transition from a semiconductor to a metal near 68 degree C. The deposition of VO2 thin films by using a process of activated-reactive evaporation provides high-quality VO2-film materials; specifically, the semiconducting phase-extinction coefficient in the infrared is reduced by an order of magnitude without detrimental effect on the corresponding metal phase coefficient. The materials improvement significantly enhances accessible performance limits for optical switching devices, as compared with VO2 thin films deposited by both standard reactive and ion-assisted reactive evaporation
Additional details
Publishing Information
- Journal Title
- Applied Optics
- Journal Volume
- 30
- Journal Issue
- 28
- Series
- Appl. Opt.
- Journal Page Range
- 4119-4123
- ISSN
- 0003-6935
- CODEN
- APOPA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23007213
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALUMINIUM OXIDES; COMPUTERS; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; INFRARED RADIATION; MEDIUM TEMPERATURE; OPACITY; PHASE TRANSFORMATIONS; SEMICONDUCTOR MATERIALS; SWITCHES; THIN FILMS; VANADIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DATA; DIFFRACTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; EQUIPMENT; FILMS; INFORMATION; MATERIALS; NUMERICAL DATA; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS