High energy tomography using cadmium zinc telluride detectors
Creators
- 1. Istituto Nazionale di Fisica Nucleare, Bologna (Italy)
- 2. Bologna Univ. (Italy). Dept. di Fisica
- 3. Lawrence Livermore National Lab., CA (United States)
Description
Cadmium zinc telluride (Cd0.8Zn0.2Te) is nowadays one of the most promising room temperature semiconductors for X- and γ-ray detection. Indeed, its physical characteristics make this detector very suitable for operating under high-intensity fluxes, such as those produced by linear accelerators. For this reason, CdZnTe has been chosen for the set-up of a tomographic facility based on a 12-MeV linear accelerator. This system is a first generation tomograph; it has already been used for preliminary phantoms image acquisition, showing rather good imaging capabilities. The polychromaticity of the source may induce severe beam-hardening artifacts in the final tomographic images. Extensive experimental studies have been carried out to optimize correction algorithms able to reduce such artifacts. A set of images of relevant samples have been acquired in order to evaluate the relationship between the absorption coefficients and the resulting CT numbers. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 380
- Journal Issue
- 1-2
- Journal Page Range
- p. 419-422.
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 9. international workshop on room temperature semiconductor X- and gamma-ray detectors, associated electronics and applications.
- Dates
- 18-22 Sep 1995.
- Place
- Grenoble (France).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 28018540
- Subject category
- S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ALGORITHMS; CDTE SEMICONDUCTOR DETECTORS; COMPUTERIZED TOMOGRAPHY; CORRECTIONS; DATA ACQUISITION; DATA ACQUISITION SYSTEMS; GAMMA DETECTION; GAMMA SOURCES; LINEAR ACCELERATORS; MEV RANGE 10-100; NONDESTRUCTIVE TESTING; OPTIMIZATION; PARTICLE BEAMS; PHOTON BEAMS; READOUT SYSTEMS; RESPONSE FUNCTIONS; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ACCELERATORS; BEAMS; DETECTION; ENERGY RANGE; FUNCTIONS; MATERIALS TESTING; MEASURING INSTRUMENTS; MEV RANGE; RADIATION DETECTION; RADIATION DETECTORS; RADIATION SOURCES; SEMICONDUCTOR DETECTORS; SORPTION; TEMPERATURE RANGE; TESTING; TOMOGRAPHY