Published December 2011
| Version v1
Journal article
Surface state effects on N+P doped electron detector
- 1. Department of Information Technology and Media, Mid Sweden University, Holmgatan 10, SE-851 70, Sundsvall (Sweden)
Description
Surface states and interface recombination velocity that exist between detector interfaces have always been known to affect the performance of a detector. This article describes how the detector performance varies when the doping profile is altered. When irradiated with electrons, the results show that while changes in the doping profile have an effect of the detector responsivity with respect to the interface recombination velocity vs, there is no visible effect with respect to fixed oxide charge Qf otherwise known as interface fixed charge density.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/6/12/C12019Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 6
- Journal Issue
- 12
- Journal Page Range
- p. C12019
- ISSN
- 1748-0221
Conference
- Title
- 13. international workshop on radiation imaging detectors
- Dates
- 3-7 Jul 2011
- Place
- Zurich (Switzerland)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44052764
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE DENSITY; DOPED MATERIALS; ELECTRONS; INTERFACES; PERFORMANCE; RECOMBINATION; SURFACES; VELOCITY
- Descriptors DEC
- ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MATERIALS