Published December 2011 | Version v1
Journal article

Surface state effects on N+P doped electron detector

  • 1. Department of Information Technology and Media, Mid Sweden University, Holmgatan 10, SE-851 70, Sundsvall (Sweden)

Description

Surface states and interface recombination velocity that exist between detector interfaces have always been known to affect the performance of a detector. This article describes how the detector performance varies when the doping profile is altered. When irradiated with electrons, the results show that while changes in the doping profile have an effect of the detector responsivity with respect to the interface recombination velocity vs, there is no visible effect with respect to fixed oxide charge Qf otherwise known as interface fixed charge density.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/6/12/C12019

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
6
Journal Issue
12
Journal Page Range
p. C12019
ISSN
1748-0221

Conference

Title
13. international workshop on radiation imaging detectors
Dates
3-7 Jul 2011
Place
Zurich (Switzerland)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44052764
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE DENSITY; DOPED MATERIALS; ELECTRONS; INTERFACES; PERFORMANCE; RECOMBINATION; SURFACES; VELOCITY
Descriptors DEC
ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MATERIALS