Effects of the film thickness of a ground plane in the SFQ circuits with a dc-power layer
- 1. Department of Quantum Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603 (Japan)
- 2. CRSET, Japan Science and Technology Agency, 102-0075, Japan (Japan)
Description
We have investigated the effect of a dc-power (DCP) layer on the performance of single flux quantum (SFQ) circuits by changing the film thickness of a ground plane (GP). The DCP layer was placed below the GP and was used as bias current feeds. Two measurements were conducted. One was direct detection of the magnetic flux above the GP by using SQUIDs. The results indicated that the GPs with film thicknesses of more than 400 nm were effective to completely suppress the flux under the condition that the return current was extracted from the ground plane. The other was evaluation of the operating margins of the 408 bit shift register circuits (SRs) with 8032 Josephson junctions and a total designed bias current of 1.05 A. The results showed that a 500 nm thick GP had an advantage over a 300 nm thick GP in the dependence of the upper margin on the bias current port of the SR
Additional details
Identifiers
- DOI
- 10.1088/0953-2048/20/11/S08;
- PII
- S0953-2048(07)52672-2;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 20
- Journal Issue
- 11
- Journal Page Range
- p. S336-S340
- ISSN
- 0953-2048
- CODEN
- SUSTEF
Conference
- Title
- 11. international superconductive electronics conference
- Acronym
- ISEC 07
- Dates
- 10-14 Jun 2007
- Place
- Washington, DC (United States)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39028945
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CURRENTS; JOSEPHSON JUNCTIONS; MAGNETIC FLUX; SQUID DEVICES; STRONTIUM SULFIDES; SUPERCONDUCTING FILMS; THICKNESS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; DIMENSIONS; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUXMETERS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; STRONTIUM COMPOUNDS; SULFIDES; SULFUR COMPOUNDS; SUPERCONDUCTING DEVICES; SUPERCONDUCTING JUNCTIONS