The performance of reflectometers at continuous wave and pulsed-neutron sources
Description
To quantify gains from time-of-flight (TOF) methods, identical reflectometers viewing a continuous wave (CW) neutron source and a variety of pulsed-neutron sources were simulated using a Monte Carlo technique. Reflectivity profiles obtained for a simple thin-film, reflecting sample were nearly identical in all simulations, and models fitted to the simulated data yielded parameters (film thickness, surface roughness, and scattering length density) that were equally accurate and precise in all cases. The simulations confirm the power of the TOF method and demonstrate that the performance of pulsed sources for reflectometry does not scale simply as the inverse duty factor of the source. In the case of long-pulse sources, the simulations suggest that pulse tails have little effect on results obtained from specular reflectometry and that maximum brightness of the neutron source should be the primary design criterion. (author) 2 figs., 2 tabs., 5 refs
Additional details
Publishing Information
- Publisher
- Paul Scherrer Institut.
- Imprint Place
- Villigen (Switzerland)
- Imprint Title
- Proceedings of the meetings ICANS-XIII and ESS-PM4. Volume I
- Imprint Pagination
- 440 p.
- Series
- PSI-Proceedings 95-02.
- Journal Page Range
- p. 381-387.
- ISSN
- 1019-6447
- Report number
- INIS-mf--14816
Conference
- Title
- 13. meeting of the International Collaboration on Advanced Neutron Sources (ICANS-XIII); 4. plenary meeting of the European Spallation Source Project (ESS).
- Dates
- 11-14 Oct 1995; 16-19 Oct 1995.
- Place
- Villigen (Switzerland); Weinfelden (Switzerland).
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 27061052
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- BRIGHTNESS; COMPUTERIZED SIMULATION; MONTE CARLO METHOD; NEUTRON SOURCES; PERFORMANCE; PULSED NEUTRON TECHNIQUES; REFLECTION; REFLECTIVITY; THEORETICAL DATA; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- CALCULATION METHODS; DATA; INFORMATION; NUMERICAL DATA; OPTICAL PROPERTIES; PARTICLE SOURCES; PHYSICAL PROPERTIES; RADIATION SOURCES; SIMULATION; SURFACE PROPERTIES