Published December 2015 | Version v1
Journal article

Macroscopic rate equation modeling of trapping/detrapping of hydrogen isotopes in tungsten materials

  • 1. CEA, IRFM, F-13108 Saint Paul lez Durance (France)
  • 2. LSPM-CNRS, Université Paris 13, Sorbonne Paris Cité, F-93430 Villetaneuse (France)
  • 3. Aix-Marseille Université, PIIM, CNRS, UMR 7345, 13397 Marseille (France)
  • 4. Université Lille I, UMET, UMR 8207, 59655 Villeneuve d'Ascq cédex France (France)

Description

Relevant parameters for trapping of Hydrogen Isotopes (HIs) in polycrystalline tungsten are determined with the MHIMS code (Migration of Hydrogen Isotopes in MaterialS) which is used to reproduce Thermal Desorption Spectrometry experiments. Three types of traps are found: two intrinsic traps (detrapping energy of 0.87 eV and 1.00 eV) and one extrinsic trap created by ion irradiation (detrapping energy of 1.50 eV). Then MHIMS is used to simulate HIs retention at different fluences and different implantation temperatures. Simulation results agree well with experimental data. It is shown that at 300 K the retention is limited by diffusion in the bulk. For implantation temperatures above 500 K, the retention is limited by trap creation processes. Above 600 K, the retention drops by two orders of magnitude as compared to the retention at 300 K. With the determined detrapping energies, HIs outgassing at room temperature is predicted. After ions implantation at 300 K, 45% of the initial retention is lost to vacuum in 300 000 s while during this time the remaining trapped HIs diffuse twice as deep into the bulk. - Highlights: • Code development to solve numerically the model equations of diffusion and trapping of hydrogen in metals. • Parametrization of the model trapping parameters (detrapping energies and density): fitting of experimental TDS spectrum. • Confrontation model/experiment: evolution of retention with fluence and implantation temperature. • Investigation of period of rest between implantation and TDS on retention and depth profile.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2015.06.041

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2015.06.041;
PII
S0022-3115(15)30066-0;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
467
Journal Issue
Part 1
Journal Page Range
p. 424-431
ISSN
0022-3115
CODEN
JNUMAM

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.