Published May 1996
| Version v1
Journal article
Surface Debye temperature measurement with reflection high-energy electron diffraction
Creators
- 1. Department of Electrical and Computer Engineering, Physical Electronics Research Institute, Old Dominion University, Norfolk, Virginia 23529-0246 (United States)
Description
Measurement of the surface mean-square atomic vibrational amplitude, or equivalently the surface Debye temperature, with reflection high-energy electron diffraction is discussed. Low-index surfaces of lead are used as examples. Particular details are given about the temperature-dependent diffraction pattern of Pb(100) in the Debye endash Waller region. The use of reflection high-energy electron diffraction for measurement of the substrate surface temperature in thin-film deposition chambers is suggested. copyright 1996 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 79
- Journal Issue
- 9
- Journal Page Range
- p. 6853-6857.
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27074098
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DEBYE TEMPERATURE; DEPOSITION; ELECTRON DIFFRACTION; LATTICE VIBRATIONS; LEAD; MOLECULAR BEAM EPITAXY; SURFACES; TEMPERATURE DEPENDENCE; THIN FILMS
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELEMENTS; EPITAXY; FILMS; METALS; SCATTERING