Published December 1, 2013
| Version v1
Journal article
Challenges for silicon pixel sensors at the European XFEL
Creators
- 1. Institute for Experimental Physics, University of Hamburg, Hamburg (Germany)
- 2. DESY, Hamburg (Germany)
- 3. National Institute of Materials Physics, Magurele (Romania)
Description
A systematic experimental study of the main challenges for silicon-pixel sensors at the European XFEL is presented. The high instantaneous density of X-rays and the high repetition rate of the XFEL pulses result in signal distortions due to the plasma effect and in severe radiation damage. The main parameters of X-ray-radiation damage have been determined and their impact on p+n sensors is investigated. These studies form the basis of the optimized design of a pixel-sensor for experimentation at the European XFEL
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2013.05.166Additional details
Identifiers
- DOI
- 10.1016/j.nima.2013.05.166;
- arXiv
- arXiv:1212.5045v1;
- PII
- S0168-9002(13)00780-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 730
- Journal Page Range
- p. 2-7
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 9. international conference on radiation effects on semiconductor materials detectors and devices
- Dates
- 9-12 Oct 2012
- Place
- Florence (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45051476
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; FREE ELECTRON LASERS; JUNCTION DETECTORS; OPTIMIZATION; POSITION SENSITIVE DETECTORS; PULSES; RADIATION EFFECTS; SEMICONDUCTOR JUNCTIONS; SENSORS; SI SEMICONDUCTOR DETECTORS; SIGNAL DISTORTION; SILICON; X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; LASERS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.