Study of short wavelength Free Electron Laser with a seed X-ray
Creators
- 1. Institute for Laser Technology, Suita, Osaka (Japan)
- 2. Osaka Univ., Suita (Japan). Faculty of Engineering
- 3. Osaka Univ., Ibaraki (Japan). Joining and Welding Research Inst.
- 4. Kansai Univ., Suita, Osaka (Japan)
- 5. Osaka Sangyo University, Daito, Osaka (Japan)
- 6. Osaka Univ., Suita (Japan). Inst. of Laser Engineering
Description
On the development of short wavelength Free Electron Lasers, there is a issue of the extremely large system. It is caused by high energy accelerator and a long wiggler. In order to solve this, we propose a system utilizing a microwiggler and seeding X-rays. Microwiggler makes it possible to lase at the wavelength of vacuum ultraviolet to soft X-ray with low energy electron beam. With seeding X-ray, quick start-up and thus short wiggler length are expected. We examined the validity of seeding X-ray using computer simulation. As a result, when seeding X-ray of 10 kW average power is supplied, it was shown that wiggler length for the radiation saturation was shortened by 60%. We are going to use Laser-produced Plasma X-ray (LPX) for the seeding X-ray source. The technique of using an ellipsoid mirror to improve coupling efficiency of LPX to seeding X-ray is also discussed. (author)
Additional details
Publishing Information
- Journal Title
- Reza Kenkyu
- Journal Volume
- 28
- Journal Issue
- 6
- Journal Page Range
- p. 370-373
- ISSN
- 0387-0200
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 31057842
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- COMPUTERIZED SIMULATION; FREE ELECTRON LASERS; GAIN; LASER-PRODUCED PLASMA; SEEDS; SOFT X RADIATION; ULTRAVIOLET RADIATION; VALIDATION; WAVELENGTHS; WIGGLER MAGNETS; X-RAY SOURCES
- Descriptors DEC
- AMPLIFICATION; ELECTROMAGNETIC RADIATION; EQUIPMENT; IONIZING RADIATIONS; LASERS; MAGNETS; PLASMA; RADIATION SOURCES; RADIATIONS; SIMULATION; TESTING; X RADIATION
Optional Information
- Notes
- 7 refs., 5 figs., 1 tab.