Published 2009 | Version v1
Miscellaneous

Diffraction Data and Microstructure of Al2O3- SiO2 Coatings after Thermal Treatment

  • 1. Institute of Atomic Energy, Otwock-Swierk (Poland)
  • 2. Institute of Metallurgy and Material Science, PAS, Cracow (Poland)

Description

no abstract available

Part of:
Annual Report 2008

Additional details

Publishing Information

Imprint Place
Otwock-Swierk (Poland)
Imprint Title
Annual Report 2008
Imprint Pagination
138 p.
Journal Page Range
p. 70
ISSN
1507-5478

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
42023874
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
No Abstract, Progress Report, Non-conventional Literature
Descriptors DEI
ALUMINIUM OXIDES; AMORPHOUS STATE; ANNEALING; LAYERS; MICROSTRUCTURE; PLASMA ARC SPRAYING; PROGRESS REPORT; SAMPLE PREPARATION; SILICON OXIDES; SURFACE TREATMENTS; X-RAY DIFFRACTION
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DOCUMENT TYPES; HEAT TREATMENTS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS; SPRAY COATING; SURFACE COATING

Optional Information

Notes
4 refs., 3 figs.; This record replaces 40097300