Published 2009
| Version v1
Miscellaneous
Diffraction Data and Microstructure of Al2O3- SiO2 Coatings after Thermal Treatment
Creators
- 1. Institute of Atomic Energy, Otwock-Swierk (Poland)
- 2. Institute of Metallurgy and Material Science, PAS, Cracow (Poland)
Description
no abstract available
Additional details
Identifiers
Publishing Information
- Imprint Place
- Otwock-Swierk (Poland)
- Imprint Title
- Annual Report 2008
- Imprint Pagination
- 138 p.
- Journal Page Range
- p. 70
- ISSN
- 1507-5478
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 42023874
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Progress Report, Non-conventional Literature
- Descriptors DEI
- ALUMINIUM OXIDES; AMORPHOUS STATE; ANNEALING; LAYERS; MICROSTRUCTURE; PLASMA ARC SPRAYING; PROGRESS REPORT; SAMPLE PREPARATION; SILICON OXIDES; SURFACE TREATMENTS; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DOCUMENT TYPES; HEAT TREATMENTS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS; SPRAY COATING; SURFACE COATING
Optional Information
- Notes
- 4 refs., 3 figs.; This record replaces 40097300