Published September 1984 | Version v1
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Measurements of low energy neutral hydrogen efflux during ICRF heating

Description

Using the Low Energy Neutral Atom Spectrometer, measurements were made of the H0 and D0 efflux from PLT during ion cyclotron heating experiments. The application of rf power at frequencies appropriate to fundamental and 2nd-harmonic heating results in a rapid, toroidally uniform rise in the charge-exchange efflux at a rate of about 1015 cm-2 s-1 MW-1. This flux increase is larger at lower plasma currents. The cause of this flux and its impact on plasma behavior are discussed

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE85002126.

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Additional details

Publishing Information

Imprint Pagination
22 p.
Report number
PPPL--2133