Published September 1984
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Measurements of low energy neutral hydrogen efflux during ICRF heating
Description
Using the Low Energy Neutral Atom Spectrometer, measurements were made of the H0 and D0 efflux from PLT during ion cyclotron heating experiments. The application of rf power at frequencies appropriate to fundamental and 2nd-harmonic heating results in a rapid, toroidally uniform rise in the charge-exchange efflux at a rate of about 1015 cm-2 s-1 MW-1. This flux increase is larger at lower plasma currents. The cause of this flux and its impact on plasma behavior are discussed
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE85002126.Files
16032296.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 22 p.
- Report number
- PPPL--2133
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 16032296
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ATOMS; CHARGE EXCHANGE; DEUTERIUM; HYDROGEN; ICR HEATING; PLT DEVICES; SPECTROSCOPY
- Descriptors DEC
- CLOSED PLASMA DEVICES; ELEMENTS; HEATING; HIGH-FREQUENCY HEATING; HYDROGEN ISOTOPES; ISOTOPES; LIGHT NUCLEI; NONMETALS; NUCLEI; ODD-ODD NUCLEI; PLASMA HEATING; STABLE ISOTOPES; THERMONUCLEAR DEVICES; TOKAMAK DEVICES