Published November 1, 2009 | Version v1
Journal article

Rule of electron-impact ionization for the damage of C, N and O clusters irradiated by XFEL

  • 1. Quantum Beam Science Directorate, Japan Atomic Energy Agency 8-1 Umemidai Kizugawa-city Kyoto 619-0215 (Japan)

Description

Single differential and integral cross sections in electron-impact ionization of atoms and ions of C, N and O are calculated with the binary encounter dipole model (Kim Y-K. and Rudd M. E., 1994 Phys. Rev. A, 50 3954) to study electron-energy distribution in the C, N and O clusters irradiated by an X-ray free electron laser (XFEL). The damages to the C, N and O clusters irradiated by XFELs are also investigated with time-dependent rate equations, considering photo-ionization, Compton scattering, Auger decay and electron-impact ionization of the atoms and ions of C, N and O. We found that the electron-impact ionization is important process to estimate the damage of carbon clusters irradiated by XFEL.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/194/4/042037

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
194
Journal Issue
4
Journal Page Range
[1 p.]
ISSN
1742-6596

Conference

Title
26. international conference on photonic, electronic and atomic collisions
Dates
22-28 Jul 2009
Place
Kalamazoo, MI (United States)