CPP-GMR films with a current-confined-path nano-oxide layer (CCP-NOL)
- 1. Corporate R and D Center, Toshiba Corporation 1, Komukai-Toshiba-cho, Saiwai-ku, Kawasaki 212-8582 (Japan)
Description
We investigated the film performance and nanostructure of current-perpendicular-to-plane giant magnetoresistance (CPP-GMR) spin-valve film with a current-confined-path nano-oxide layer (CCP-NOL). By applying ion-assisted oxidation (IAO) for the CCP-NOL formation, we enhanced the MR ratio to 5.4% at a small RA value of 500 mΩ μm2 for conventional Co90Fe10 layers. Furthermore, the use of bcc-Fe50Co50 also increased the MR ratio to 8.2% at a small RA value of 580 mΩ μm2. A modified Valet-Fert model for the CCP-NOL showed that the MR enhancement by the IAO is due to the improvement in resistivity of the CCP, and that by Fe50Co50 is due to a larger spin-dependent interface scattering effect. Analysis by cross-sectional TEM and three-dimensional atom probe confirmed the formation of the CCP-NOL structure. A reliability test for test element devices showed almost no change even under acceleration stress. The CPP-GMR spin-valve film with the CCP-NOL is extendable to future high-density recording heads due to its potential for a higher MR ratio at a small value of RA
Additional details
Identifiers
- DOI
- 10.1088/0022-3727/40/5/S01;
- PII
- S0022-3727(07)30574-3;
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 40
- Journal Issue
- 5
- Journal Page Range
- p. 1213-1220
- ISSN
- 0022-3727
- CODEN
- JPAPBE
Conference
- Title
- 19. international colloquium on magnetic films and surfaces
- Acronym
- ICMFS 2006
- Dates
- 14-18 Aug 2006
- Place
- Sendai (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38085995
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATION; BCC LATTICES; COBALT ALLOYS; FILMS; INTERFACES; IRON ALLOYS; LAYERS; MAGNETORESISTANCE; NANOSTRUCTURES; OXIDATION; OXIDES; PERFORMANCE; RELIABILITY; SCATTERING; SPIN; STRESSES; THREE-DIMENSIONAL CALCULATIONS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; ANGULAR MOMENTUM; CHALCOGENIDES; CHEMICAL REACTIONS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; MICROSCOPY; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; TRANSITION ELEMENT ALLOYS