Published September 14, 2015 | Version v1
Journal article Metadata-only

Surface acoustic wave propagation in graphene film

Creators

  • 1. Institute of Microelectronics Technology and High-Purity Materials Russian Academy of Sciences, Chernogolovka 142432 (Russian Federation)
  • 2. Laboratoire de Physique des Solides, Univ. Paris-Sud, CNRS, UMR 8502, 91405 Orsay Cedex (France)
  • 3. Institute for Nanometre Optics and Technology, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein Strasse 15, 12489 Berlin (Germany)
  • 4. Nazarbayev University Research and Innovation System, 53 Kabanbay Batyr St., Astana 010000 (Kazakhstan)

Description

Surface acoustic wave (SAW) propagation in a graphene film on the surface of piezoelectric crystals was studied at the BESSY II synchrotron radiation source. Talbot effect enabled the visualization of the SAW propagation on the crystal surface with the graphene film in a real time mode, and high-resolution x-ray diffraction permitted the determination of the SAW amplitude in the graphene/piezoelectric crystal system. The influence of the SAW on the electrical properties of the graphene film was examined. It was shown that the changing of the SAW amplitude enables controlling the magnitude and direction of current in graphene film on the surface of piezoelectric crystals

Additional details

Identifiers

DOI
10.1063/1.4930050;

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
118
Journal Issue
10
Journal Page Range
p. 104901-104901.5
ISSN
0021-8979
CODEN
JAPIAU

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47059536
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
AMPLITUDES; BESSY STORAGE RING; CRYSTALS; CURRENTS; ELECTRICAL PROPERTIES; FILMS; GRAPHENE; PIEZOELECTRICITY; RESOLUTION; SOUND WAVES; SURFACES; SYNCHROTRON RADIATION SOURCES; X-RAY DIFFRACTION
Descriptors DEC
CARBON; COHERENT SCATTERING; DIFFRACTION; ELECTRICITY; ELEMENTS; NONMETALS; PHYSICAL PROPERTIES; RADIATION SOURCES; SCATTERING; STORAGE RINGS

Optional Information

Notes
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