Transverse phase space measurement based on computerized tomography

Precise measurements of emittance and transverse phase space are essential to generation and applications of high brightness electron beams. Compared to the quadrupole-scanning technique which treats the phase space distributions as ellipses and only measure the sigma matrices that define the ellipses, the measurement of transverse phase space based on CT (computerized tomography) measures the actual phase space distributions while making no a priori assumptions about the distributions. This process is capable of reconstructing transverse phase space distributions that are not elliptical. The theories of CT based measurements are studied. The preliminary experiment result is presented which is in good agreement with that obtained from quadruple scanning. (authors)