Low-energy electron and positron diffraction measurements and analysis on Cu(100)
- 1. Department of Physics, Brookhaven National Laboratory, Upton, New York 11973
Description
The results of an experimental study and quantitative analysis of the intensity versus energy (I-V) curves are reported for low-energy electron diffraction and low-energy positron diffraction (LEPD) with a brightness-enhanced electrostatically focused positron beam. In a close comparative study, the incident electrons and positrons scattered at a large incident polar angle (theta≥500) with respect to the surface normal off clean Cu(100) and the I-V spectra from six and seven diffraction beams were taken with electrons and positrons, respectively. The analysis of the experimental data from the electron studies indicates first- and second-layer relaxation that is consistent with earlier results. Use of the structure derived from the electron studies, analysis of the I-V curves from the LEPD studies suggests that the attenuation for positrons is greater than the value for electrons over the energy range 50--400 eV, possibly as a result of the enhanced electron-image cloud surrounding the positron. The real part of the inner potential is 0 eV for positrons compared with 11 eV for electrons, in rough agreement with predictions. Further, the best agreement between experiment and calculation for LEPD I-V curve analysis tends to favor the potential formed by changing of the sign of the Coulomb term (relative to electrons), eliminating the exchange, and retaining the correlation term
Additional details
Publishing Information
- Journal Title
- Phys. Rev., B: Condens. Matter
- Journal Volume
- 35
- Journal Issue
- 7
- Series
- Phys. Rev., B: Condens. Matter.
- Journal Page Range
- 3102-3110
- ISSN
- 0163-1829
- CODEN
- PRBMD
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18055298
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATTENUATION; COPPER; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; EXCHANGE INTERACTIONS; MEASURING METHODS; POSITRON COLLISIONS
- Descriptors DEC
- COHERENT SCATTERING; COLLISIONS; DIFFRACTION; ELEMENTS; INTERACTIONS; METALS; SCATTERING; TRANSITION ELEMENTS