Published December 30, 2010 | Version v1
Journal article

Fabrication of horizontally grown silicon nanowires using a thin aluminum film as a catalyst

  • 1. University of Arkansas, Fayetteville, Arkansas 72701 (United States)
  • 2. Lebanese American University, Natural Science Department, Byblos Campus, PO Box 36, Byblos (Lebanon)

Description

We present a new method for the fabrication of horizontal silicon nanowires for application in nanoelectronic devices. A web of horizontally connected silicon nanowires is grown on a silicon substrate using a thin aluminum film as a catalyst. A thin layer of oxide is thermally grown on a silicon substrate. The oxide layer is then selectively etched using photolithography. A thin layer of aluminum is thermally evaporated on the substrate with the patterned oxide layer. When the sample is annealed above the eutectic temperature, we show that the silicon gets deposited along the grain boundaries of aluminum in the form of thin nanowires. We show that this phenomenon is due to the high solubility of silicon in aluminum at high temperatures. The surface morphology was analyzed using Scanning Electron Microscopy (SEM). The compositional analysis was done using Energy Dispersive X-ray spectroscopy (EDX).

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2010.08.155

Additional details

Identifiers

DOI
10.1016/j.tsf.2010.08.155;
PII
S0040-6090(10)01286-1;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
5
Journal Page Range
p. 1681-1686
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
37. international conference on metallurgical coatings and thin films (ICMCTF)
Acronym
ICMCTF 2010
Dates
26-30 Apr 2010
Place
San Diego, CA (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42069321
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM; ANNEALING; CATALYSTS; EUTECTICS; FABRICATION; GRAIN BOUNDARIES; LAYERS; MORPHOLOGY; OXIDES; QUANTUM WIRES; SCANNING ELECTRON MICROSCOPY; SILICON; SOLUBILITY; SURFACES; THIN FILMS; X-RAY SPECTROSCOPY
Descriptors DEC
CHALCOGENIDES; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HEAT TREATMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; NANOSTRUCTURES; OXYGEN COMPOUNDS; SEMIMETALS; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.