Published 1985
| Version v1
Journal article
Honeywell hardened microelectronics
Creators
- 1. Honeywell Digital Product Center, Colorado Springs, CO
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Trans. Am. Nucl. Soc.
- Journal Volume
- 49
- Series
- Trans. Am. Nucl. Soc.
- Journal Page Range
- 27-29
- ISSN
- 0003-018X
- CODEN
- TANSA
Conference
- Title
- Annual meeting of the American Nuclear Society.
- Dates
- 9-14 Jun 1985.
- Place
- Boston, MA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17027587
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- DOSE RATES; GALLIUM ARSENIDES; INTEGRATED CIRCUITS; MICROELECTRONIC CIRCUITS; RADIATION HARDENING; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR STORAGE DEVICES
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; ELECTRONIC CIRCUITS; GALLIUM COMPOUNDS; HARDENING; MATERIALS; MEMORY DEVICES; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- Published in summary form only.
- Secondary number(s)
- CONF-850610--.