Quantitative microanalysis of hafnium - zirconium system by X-ray fluorescence

X-ray fluorescence technique has been used for the analysis of Hf in the presence of Zr by developing a method. In this method the spectral interference of Hf lines by Zr is eliminated completely and the Hf detection is accomplished using the most efficient Li line of its L-series. The principle of the method is based on the extinction properties of crystals for some orders of reflection. Ge(III) is used as the analyzing crystal. This method can be used accurately to detect Hf in any concentration of Zr at least from about 20 ppm to 100%. Also no information about the expected range of the analyte sample, is required in advance. (authors)