Published 1979 | Version v1
Miscellaneous

Some possibilities for measuring thickness of coatings by means of the X-ray fluorescence method

  • 1. Institute of Nuclear Research, Warsaw (Poland)

Description

Possibilities are analysed in the paper of the measurement of thickness of coatings by means of the X-ray fluorescence method with application of the GP-type transducers. This transducer is one of the elements of the AF-11 analyzer. Results are given of the thickness measurements of the one-layer and also some two-layers coatings. Analysis has been done of the factors, conditioning the accuracy and sensitivity of measurements as well as the measurements range in the application of radioisotope sources of the soft X-ray radiation from cadmium-109 and americium-241

Additional details

Additional titles

Original title (Russian)
Некоторые возможности измерения толщины покрытий рентгенофлюоресцентным методом

Publishing Information

Publisher
FEB ''Kongress und Werbedruck''.
Imprint Place
Oberlungvitz, GDR
Imprint Title
CMEA member-states symposium on the radioisotope methods application in industry, including means of control and operation
Journal Page Range
p. 296-309.
Report number
INIS-mf--6311

Conference

Title
Radioisotope methods application in industry, including means of control and operation.
Dates
26 - 29 Sep 1978.
Place
Leipzig, German Democratic Republic.

Optional Information

Notes
6 refs.; 7 figs.; 1 table. Imprint:Simpozium stran-chlenov SEhV po primeneniyu radioizotopnykh metodov v promyshlennosti, vklyuchaya sredstva kontrolya i upravleniya.;Tom 3, Doklady sektsii 2.
Secondary number(s)
L--19-79-020077.