Published June 1988 | Version v1
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Deuterium pumping and erosion behavior of selected graphite materials under high flux plasma bombardment in PISCES

Description

Deuterium plasma recycling and chemical erosion behavior of selected graphite materials have been investigated using the PISCES-A facility. These materials include: Pyro-graphite; 2D-graphite weave; 4D-graphite weave; and POCO-graphite. Deuterium plasma bombardment conditions are: fluxes around 7 /times/ 1017 ions s/sup /minus/1/cm/sup /minus/2/; exposure time in the range from 10 to 100 s; bombarding energy of 300 eV; and graphite temperatures between 20 and 120/degree/C. To reduce deuterium plasma recycling, several approaches have been investigated. Erosion due to high-fluence helium plasma conditioning significantly increases the surface porosity of POCO-graphite and 4D-graphite weave whereas little change for 2D-graphite weave and Pyro-graphite. The increased pore openings and refreshed in-pore surface sites are found to reduce the deuterium plasma recycling and chemical erosion rates at transient stages. The steady state recycling rates for these graphite materials can be also correlated to the surface porosity. Surface topographical modification by machined-grooves noticeably reduces the steady state deuterium recycling rate and the impurity emission from the surface. These surface topography effects are attributed to co-deposition of remitted deuterium, chemically sputtered hydrocarbon and physically sputtered carbon under deuterium plasma bombardment. The co-deposited film is found to have a characteristic surface morphology with dendritic microstructures. 18 ref., 4 figs., 1 tab

Availability note (English)

Available from NTIS, PC A03/MF A01; 1 as DE88012408.

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Additional details

Publishing Information

Imprint Pagination
18 p.
Report number
UCLA/PPG--1159

Conference

Title
8. international conference on plasma surface interactions in controlled fusion devices.
Dates
2-6 May 1988.
Place
Juelich (Germany, F.R.).

Optional Information

Notes
Portions of this document are illegible in microfiche products.
Secondary number(s)
CONF-880512--8.