Published January 13, 2003 | Version v1
Journal article

Combinatorial near-edge x-ray absorption fine structure: Simultaneous determination of molecular orientation and bond concentration on chemically heterogeneous surfaces

  • 1. Department of Chemical Engineering, North Carolina State University, Raleigh, North Carolina 27695-7905 (United States)
  • 2. Material Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

Description

We show that simultaneous molecular orientation and bond chemistry of planar chemically heterogeneous surfaces can be obtained by combining near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and rastering the incident x-ray beam on the specimen. This rastering produces serially two-dimensional NEXAFS images in space and energy, revealing information about the chemistry (including bond concentration) and orientation of the surface-bound molecules with submillimeter planar spatial resolution and submonolayer molecular sensitivity. We illustrate the power of the combinatorial NEXAFS method by simultaneously probing the concentration and molecular orientation of semifluorinated (SF) molecules in double-SF molecular gradients on flat silica substrates

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
82
Journal Issue
2
Journal Page Range
p. 266-268
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35037737
Subject category
S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; FINE STRUCTURE; HETEROGENEOUS EFFECTS; LAYERS; ORIENTATION; SILICA; SUBSTRATES; SURFACES; X-RAY SPECTROSCOPY
Descriptors DEC
MINERALS; OXIDE MINERALS; SPECTROSCOPY

Optional Information

Notes
(c) 2003 American Institute of Physics.