Combinatorial near-edge x-ray absorption fine structure: Simultaneous determination of molecular orientation and bond concentration on chemically heterogeneous surfaces
- 1. Department of Chemical Engineering, North Carolina State University, Raleigh, North Carolina 27695-7905 (United States)
- 2. Material Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
Description
We show that simultaneous molecular orientation and bond chemistry of planar chemically heterogeneous surfaces can be obtained by combining near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and rastering the incident x-ray beam on the specimen. This rastering produces serially two-dimensional NEXAFS images in space and energy, revealing information about the chemistry (including bond concentration) and orientation of the surface-bound molecules with submillimeter planar spatial resolution and submonolayer molecular sensitivity. We illustrate the power of the combinatorial NEXAFS method by simultaneously probing the concentration and molecular orientation of semifluorinated (SF) molecules in double-SF molecular gradients on flat silica substrates
Additional details
Identifiers
- DOI
- 10.1063/1.1535271;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 82
- Journal Issue
- 2
- Journal Page Range
- p. 266-268
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35037737
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; FINE STRUCTURE; HETEROGENEOUS EFFECTS; LAYERS; ORIENTATION; SILICA; SUBSTRATES; SURFACES; X-RAY SPECTROSCOPY
- Descriptors DEC
- MINERALS; OXIDE MINERALS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2003 American Institute of Physics.