Published 1989
| Version v1
Miscellaneous
Polarity determination of epitaxial structures of CdTe on GaAs by channelling technique
Creators
- 1. Commonwealth Scientific and Industrial Research Organization, Lucas Heights (Australia). Div. of Applied Physics
Description
Commercially available (111) CdTe epitaxial layers on 50 mm diameter sapphire have been analyzed using a 3MV particle accelerator as a source of 2 MeV helium ions. The results of the Rutherford backscattering channelling analysis indicate a (111)A face and are in agreement with independent polarity determination of a sample by X-ray diffraction. The advantages of polarity determination by (111) planar ion channeling over X-ray diffraction are discussed
Additional details
Publishing Information
- Publisher
- AINSE.
- Imprint Place
- Lucas Heights (Australia)
- Imprint Title
- Sixth Australian conference on nuclear techniques of analysis: proceedings
- Imprint Pagination
- 240 p.
- Journal Page Range
- p. 112-114.
- Report number
- INIS-mf--12680
Conference
- Title
- 6. Australian conference on nuclear techniques of analysis.
- Dates
- 8-10 Nov 1989.
- Place
- Lucas Heights (Australia).
INIS
- Country of Publication
- Australia
- Country of Input or Organization
- Australia
- INIS RN
- 21068845
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CADMIUM TELLURIDES; CRYSTAL DEFECTS; CRYSTAL LATTICES; EPITAXY; GALLIUM ARSENIDES; HELIUM IONS; INCIDENCE ANGLE; ION BEAMS; ION CHANNELING; POLARIZATION; RUTHERFORD SCATTERING; SAPPHIRE; SEMICONDUCTOR MATERIALS; SPECIFICITY; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; BEAMS; CADMIUM COMPOUNDS; CHALCOGENIDES; CHANNELING; CHARGED PARTICLES; COHERENT SCATTERING; CORUNDUM; CRYSTAL STRUCTURE; DIFFRACTION; ELASTIC SCATTERING; FILMS; GALLIUM COMPOUNDS; IONS; MATERIALS; MINERALS; OXIDE MINERALS; PNICTIDES; SCATTERING; TELLURIDES; TELLURIUM COMPOUNDS