Measurement of diffraction parameters of Y3Al5O12 in a wide band of wavelengths from 0.06 to 0.2 nm

The spectral dependences of the integral coefficient of X-ray diffraction of (220), (400) and (224) crystal planes of Y3Al5O12 were measured within the wavelength interval 0.06-0.2 nm using synchrotron radiation. The widths of diffraction maxima for the same plane were measured. It is shown that the reflectivity of Y3Al5O12 for the reflections studied is higher than that of Si(333). The structure factors of scattering for (400), (224) and (220) reflections are calculated using the measured values of anti R(λ) and are equal to 224, 145 and 81, respectively. (orig.)