Published November 15, 2016 | Version v1
Journal article

The error analysis of the reverse saturation current of the diode in the modeling of photovoltaic modules

  • 1. Key Laboratory of Magnetic Levitation Technologies and Maglev Trains (Ministry of Education), Superconductor and New Energy R&D Center, Mail Stop 165#, Southwest Jiaotong University, Chengdu, 610031 (China)
  • 2. School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, 610031 (China)
  • 3. Superconductivity Research Group, School of Materials Science and Engineering, University of New South Wale, Sydney, 2052 NSW (Australia)

Description

In the modeling and simulation of photovoltaic modules, especially in calculating the reverse saturation current of the diode, the series and parallel resistances are often neglected, causing certain errors. We analyzed the errors at the open circuit point, and proposed an iterative algorithm to calculate the modified values of the reverse saturation current, series resistance and parallel resistance of the diode, in order to reduce the errors. Assuming independent irradiation and temperature effects, the irradiation-dependence and the temperature-dependence of the open circuit voltage were introduced to obtain the modified formula of the open circuit voltage under any condition. Experimental results show that this modified formula has high accuracy, even at irradiance as low as 40 W/m2. The errors of open circuit voltage were significantly reduced, indicating that this modified model is suitable for simulations of photovoltaic modules. - Highlights: • We propose a new method for modeling PV modules with higher accuracy. • The errors of open circuit voltage are significantly reduced. • Io under any condition is calculated.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.energy.2016.08.098

Additional details

Identifiers

DOI
10.1016/j.energy.2016.08.098;
PII
S0360-5442(16)31211-7;

Publishing Information

Journal Title
Energy (Oxford)
Journal Volume
115
Journal Issue
Part 1
Journal Page Range
p. 478-485
ISSN
0360-5442
CODEN
ENEYDS

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.