Published July 1988
| Version v1
Journal article
Optimization in spot sizes of focused MeV ion beam by precise adjustment of lens-current excitations
Creators
- 1. Osaka Univ., Toyonaka (Japan). Faculty of Engineering Science
Description
Effects of lens-current excitations and object slit width on the beam spot sizes have been investigated to minimize the spot size in a microbeam line with 1.5 MeV helium ions, focused by piezo-driven object slits and a magnetic quadrupole doublet. Deviation of a lens-current excitation by 0.5 % gave rise to an 80 % increase in the beam spot size. A minimum spot size of 0.9 μm x 1.2 μm was obtained by an improvement in the adjustment of the lens-current excitations. (author)
Additional details
Publishing Information
- Journal Title
- Jpn. J. Appl. Phys., Part 2
- Journal Volume
- 27
- Journal Issue
- 7
- Series
- Jpn. J. Appl. Phys., Part 2.
- Journal Page Range
- L1346-L1348
- ISSN
- 0021-4922
- CODEN
- JAPLD
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 19096693
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ELECTRIC CURRENTS; ELECTRON MICROSCOPY; ELECTROSTATIC LENSES; EXCITATION; FOCUSING; HELIUM IONS; ION BEAMS; ION MICROPROBE ANALYSIS; OPTIMIZATION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; CURRENTS; ENERGY-LEVEL TRANSITIONS; IONS; LENSES; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS