Published December 28, 1968 | Version v1
Patent Restricted

Detector used in a back-scattering type radiometric thickness gauge

Creators

Description

no abstract available

Availability note (English)

MF available from INIS under the Report Number.

Files

Restricted

The record is publicly accessible, but files are restricted to users with access.

Additional details

Publishing Information

Imprint Pagination
3 p.
IPC:
Int. Cl. G01b.
IPC
Int. Cl. G01b.
Patent number
JP patent document 1973-21574/B/

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
6192505
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
CONFIGURATION; IONIZATION CHAMBERS; RADIOMETRIC GAGES; SURFACE COATING; THICKNESS; THICKNESS GAGES
Descriptors DEC
DEPOSITION; DIMENSIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS