V2O5 phase diagram revisited at high pressures and high temperatures
- 1. Max-Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70186 Stuttgart (Germany)
Description
New experiments on V2O5 have been performed using large volume high pressure and high temperature devices, to pressures up to 29 GPa and temperatures up to 1500 oC. Post-temperature and pressure quench, samples have been structurally analysed using X-ray diffraction and Raman spectroscopy. Data obtained confirms earlier experimental results at elevated pressures and temperatures, and reveals the stability range of the high-pressure phases far beyond the previously known region. Rietveld refinement of the δ-phase of V2O5 shows that the phase crystallizes in space group C12/c1 (no. 15) with a = 11.9719(2) A, b = 4.7017(1) A, c = 5.3253(1) A, β = 104.41(0)o, V = 290.32(7) A3 and Z = 4. The tentative mapping of phase boundaries is also in agreement with our theoretical predictions for pressure-induced transitions at absolute zero temperature
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2006.04.042;
- PII
- S0925-8388(06)00441-5;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 429
- Journal Issue
- 1-2
- Journal Page Range
- p. 87-98
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39013216
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPUTERIZED SIMULATION; CRYSTAL STRUCTURE; PHASE DIAGRAMS; PRESSURE RANGE GIGA PA; RAMAN SPECTROSCOPY; SPACE GROUPS; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; TEMPERATURE ZERO K; VANADIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; INFORMATION; LASER SPECTROSCOPY; OXIDES; OXYGEN COMPOUNDS; PRESSURE RANGE; SCATTERING; SIMULATION; SPECTROSCOPY; SYMMETRY GROUPS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.