Published 1980 | Version v1
Book Metadata-only

Analysis for extraction and bunching of light ion beam

Creators

  • 1. Tokyo Inst. of Tech. (Japan)

Description

no abstract available

Additional details

Publishing Information

Publisher
Inst. of Electr. Eng. of Japan.
Imprint Place
Tokyo, Japan
Imprint Title
Proceedings of the fourth symposium on ion sources and ion application technology
Imprint Pagination
388 p.
Journal Page Range
p. 5-8.

Conference

Title
4. symposium on ion sources and ion application technology.
Dates
24 - 26 Jun 1980.
Place
Tokyo, Japan.

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
12628451
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
ANODES; BEAM BUNCHING; BEAM EXTRACTION; CATHODES; ELECTRIC POTENTIAL; INERTIAL CONFINEMENT; ION BEAMS; PLASMA; TARGETS; TIME DEPENDENCE; TRIODE TUBES
Descriptors DEC
BEAM DYNAMICS; BEAMS; CONFINEMENT; ELECTRODES; ELECTRON TUBES

Optional Information

Notes
Published in summary form only.