Thickness and microstructure characterization of TGO in thermal barrier coatings by 3D reconstruction

Yttria-stabilized zirconia (YSZ) thermal barrier coatings (TBCs) are prepared by plasma spraying. Thermally grown oxide (TGO) would be formed between YSZ topcoat and bond coat after 50 h thermal service for YSZ TBCs. The electron back scattered diffraction (EBSD) results reveal that the TGO layer is composed of α-Al₂O₃ and cubic Al₂NiO₄ layers. Measured values of TGO thickness from the 2D-SEM image are greater than or equal to its real thickness due to the fact that the TGO layer is much rolling so that up and down surfaces of the TGO can't be completely perpendicular to the cross-section direction confirmed by 3D-SEM. Furthermore, 3D-SEM results reveal that the real thickness of TGO layer is 3.10 μm instead of 7.1 μm. In addition, 3D-EBSD confirmed that α-Al₂O₃ layer in TGO is composed of single layer of grains and Al₂NiO₄ layer consist of multilayer of grains while α-Al₂O₃ layer is mixed with single layer and multilayer of α-Al₂O₃ grains from observation of the 2D-EBSD image. It provides a new method to characterize real thickness and microstructure of TGO, which is also applied to other film materials. - Highlights: •This work provides a new method to measure the real thickness of TGO. •YSZ TBCs were prepared by plasma spraying. •TGO is formed in TBCs by simulating thermal service at 1100 °C for 50 h. •Real thickness and microstructure of TGO were investigated by 3D reconstruction.