Published 2011 | Version v1
Book

The suitability of large area drift chambers as the technology choice for the Cosmic Ray Inspection and Passive Tomography (CRIPT) project

  • 1. Atomic Energy Canada Ltd., Chalk River, ON K0J 1J0 (Canada)
  • 2. Carleton Univ., Ottawa, ON (Canada)
  • 3. Advanced Applied Physics Solutions, Vancouver, BC (Canada)
  • 4. Canadian Border Services Agency, Ottawa, ON K1A 0L8 (Canada)
  • 5. International Safety Research, Ottawa, ON K2E 7J6 (Canada)
  • 6. Health Canada, Ottawa, ON K1A 0K9 (Canada)
  • 7. Defence Research Development Canada, Ottawa, ON K1A 0Z4 (Canada)

Description

The CRIPT project brings together several Canadian institutions, concerned with the detection of Special Nuclear Materials (SNM), addressing a requirement at ports-of-entry for detection of SNM in the many thousands of containers that flow into and out of Canada every day, while at the same time providing a way of monitoring the contents of nuclear waste storage containers, for waste management and non-proliferation reasons. The scale of these applications is large - typically tens of cubic metres, requiring detectors that can cover a large area at a minimum cost. The CRIPT project considered drift chambers adapted from high energy physics experience, as one of its technology choices. We report here on the performance of a full scale prototype, which covers an area of 2.4 m x 1.2 m with only 6 readout channels, and provides a 2D data point with accuracies (in x and z) of around 2 mm. (authors)

Availability note (English)

Available from doi: http://dx.doi.org/10.1109/ANIMMA.2011.6172947

Additional details

Identifiers

Publishing Information

Publisher
Inst. of Electrical and Electronics Engineers - IEEE
Imprint Place
Piscataway, NJ (United States)
ISBN
978-1-4577-0926-5
Imprint Pagination
4 p.

Conference

Title
2. International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications
Acronym
ANIMMA 2011
Dates
6-9 Jun 2011
Place
Ghent (Belgium)

Optional Information

Notes
12 refs.; IEEE Catalog Number: CFP1124I-CDR