Towards the ultimate x-ray microscope. Chapter 7

A review is presented of the developments in X-ray microscopy which have occurred since 1965. Various X-ray sources are discussed such as conventional thermionic or field emission of electrons, plasma sources, synchrotron radiation, X-ray lasers and free electron oscillators. Typical electron current densities and duration are given in appropriate cases. The X-ray imaging geometries and the various detection systems are described in detail. The detection systems range from photographic materials and fluorescent screens to gas proportional counters, image intensifiers, microchannel plates and semi-conductor detectors. Finally, the recent and rapid developments in image processing are discussed. In a concluding section, the advantages and disadvantages of 19 of the most significant options for X-ray microscopes are compared. (U.K.)