Published February 2005
| Version v1
Journal article
Using the multilayer structures for background determination during absolute measurements of the absorption sections in the region of the X spectra fine structure
Creators
- 1. Syktyvkarskij Gosudarstvennyj Univ., Syktyvkar (Russian Federation)
- 2. Inst. Fiziki Sankt-Peterburgskogo Gosudarstvennogo Univ., Petergof (Russian Federation)
Description
The problem of absolute section of absorption section in ultrasoft range of X-ray spectra was considered. The method of immediate measurement of scattering nonmonochromic background in continuous radiation was described and its justification with help of application of two-layer reflected coatings was carried
Abstract (Russian)
Рассмотрена проблема абсолютных измерений сечений поглощения в ультрамягкой рентгеновской области спектра. Описана методика непосредственного измерения рассеянного немонохроматического фона в непрерывном излучении и проведено ее обоснование с помощью применения двухслойных отражающих покрытийAdditional details
Additional titles
- Original title (Russian)
- Применение многослойных структур для определения фона при абсолютных измерениях сечений поглощения в области тонкой структуры рентгеновских спектров
Publishing Information
- Journal Title
- Poverkhnost'. Rentgenovskie, Sinkhrotronnye i Nejtronnye Issledovaniya
- Journal Issue
- no.2
- Journal Page Range
- p. 103-108
- ISSN
- 1028-0960
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 38011501
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION; BACKGROUND RADIATION; CROSS SECTIONS; EV RANGE; FINE STRUCTURE; LAYERS; OPACITY; REFLECTIVE COATINGS; SOFT X RADIATION; TITANIUM; X-RAY SPECTRA
- Descriptors DEC
- COATINGS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; IONIZING RADIATIONS; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SORPTION; SPECTRA; TRANSITION ELEMENTS; X RADIATION
Optional Information
- Notes
- 10 refs., 5 figs.