Published 2006
| Version v1
Miscellaneous
Open
Topographic Investigation of SiC Crystals
- 1. Institute of Electronic Materials Technology, Warsaw (Poland)
- 2. Institute of Atomic Energy, Otwock-Swierk (Poland)
- 3. HASYLAB at DESY, Hamburg (Germany)
Description
no abstract available
Files
37103133.pdf
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(893.1 kB)
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Additional details
Publishing Information
- Imprint Place
- Otwock-Swierk (Poland)
- Imprint Title
- Annual Report 2005
- Imprint Pagination
- 124 p.
- Journal Page Range
- p. 61
- ISSN
- 1507-5478
- Report number
- INIS-PL--2006-0009
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 37103133
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Progress Report
- Descriptors DEI
- CRYSTAL STRUCTURE; DEFORMATION; ELECTRON MICROSCOPY; OPTICAL MICROSCOPY; PROGRESS REPORT; SEMICONDUCTOR MATERIALS; SILICON CARBIDES; TESTING; X-RAY DIFFRACTION
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; DOCUMENT TYPES; MATERIALS; MICROSCOPY; SCATTERING; SILICON COMPOUNDS
Optional Information
- Notes
- 1 fig.